Slaughter Test Systems
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Model 1740
Test System
Description   Top  

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The fully programmable Model 1740 facilitates high speed, production line testing in both automated and manual applications. Standard tests include AC Hipot, DC Hipot, Resistance, patented Tang-Weld Resistance and Surge. Robust software offers automatic setup of all test parameters, complete result storage, Go/No-Go testing requiring no operator judgment, and online statistics for all tests.

Whether you need flexibility, reliability, durability, accuracy, speed or data, the Model 1740 has it all. Take a closer look and see why this is simply the best test system available.
Flexibility and Control   Top  

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The Model 1740 builds on a long-standing foundation of flexible, powerful test software for the manufacturing environment. In addition to standard tests, optional tests include double insulated Hipot and Polarity. Our unique modular software approach allows the addition of standard options and custom tests or applications upon initial delivery or at any time following installation. This accommodates changing demands and requirements by building on an existing platform rather than replacing software each time change is necessary.

Both automated and manual applications benefit from the flexibility of up to four test stations and the enhanced interface capabilities of the Model 1740. Intuitive displays and indicators minimize error and maximize throughput by simplifying operator notification. A full range of user selectable inputs and outputs allow seamless integration into any automated environment.
Data and Security   Top  

Data management has never been easier with multi-level password protection to ensure the security and integrity of test parameters and data. Built-in utilities allow local/network backup and retrieval of setup and configuration data with the push of a button. All test results are available in both numeric and graphic format and are stored in standard Microsoft database format, allowing easy access from external spreadsheet and database applications.
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